2006 IEEE International On-Line Testing Symposium free

Book Details:

• Author: Institute of Electrical and Electronics Engineers
• Published Date: 25 Apr 2007
• Publisher: IEEE Computer Society Press,U.S.
• Original Languages: English
• Book Format: Paperback::250 pages
• ISBN10: 0769526209
• Publication City/Country: Los Alamitos, United States
• Filename: 2006-ieee-international-on-line-testing-symposium.pdf
Download Link: 2006 IEEE International On-Line Testing Symposium

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